Inverse scattering method based on contour deformations using a fast marching method

Abstract

A shape reconstruction method for microwave imaging of perfect electric conductor objects based on contour deformations exploiting the level set method is presented. The calculation of the method of moments impedance matrix in the direct scattering part is done in a single step using the relation of the original and adjoint systems. In the inverse scattering part the fast marching method is used in the re-initialization process which has drastically improved the velocity of the reconstruction. Based on the simulation results the inverse scattering method presented in this paper has proved to be efficient and accurate, giving highly accurate reconstructions in relatively short computational times for single or multiple objects and also in the presence of noise. The accuracy and efficiency of the method suggest that it could usefully be extended to the three-dimensional case. © 2010 IOP Publishing Ltd.