The Electrical and Thermal Analyses of Aluminized PET for Use in Thermal Layers

Abstract

In this study, using the physical vapor deposition (PVD) method by thermal evaporation technique, aluminum was deposited on a 13-μm polyethylene terephthalate (PET) substrate. A 150-nm-thick layer of aluminum was deposited on both sides of the substrate for use in thermal layers. The thermal properties, including the specific heat capacity, thermal conductivity coefficient, and thermal expansion coefficient, were measured by differential scanning calorimetry (DSC), thermomechanical analysis (TMA), and xenon flash analysis (XFA), respectively. The electrical analyses were carried out to determine the breakdown voltage, volumetric resistance, and dielectric strength, and the results were analyzed. The electrical capacitance of the sample (sample is capacitive with dielectric PET) was obtained through simulation. The dielectric constant and the electrical resistance were calculated using the obtained values of the two parameters and compared with the measurement results. The Al-PET temperature glass (Tg) value was measured by TMA and DSC analyses. A comparison of the results shows that they are the same. © 2020, The Minerals, Metals & Materials Society.