Background
Type: Article

Yttria shell thickness estimation of alumina/yttria core/shell nanoparticles via X-ray diffraction analysis

Journal: Materials Chemistry and Physics (02540584)Year: 2019/02/01Volume: 223Issue: Pages: 564 - 568
Kafili G.Movahedi B.aDini G.a Milani M.

Abstract

In this study, alumina/yttria core/shell nanoparticles with different yttria shell thicknesses were synthesized via a partial wet chemical route. The formation of core/shell nanoparticles was investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM) techniques. The yttria shell thickness was determined from the peak broadening and the volume fraction of the coating phase obtained from the XRD pattern via the Rietveld method and compared with the TEM micrograph. The results indicated that the XRD is an effective method for the quantitative analysis of the core/shell nanoparticles structure yielding the shell thickness as a function of the crystallite size within the relatively wide range of shell thickness. © 2018 Elsevier B.V.


Author Keywords

Alumina/yttria core/shell nanoparticlesThe rietveld methodThicknessX-ray diffractionAluminaAluminum oxideCrystallite sizeHigh resolution transmission electron microscopyNanoparticlesRietveld analysisScanning electron microscopyShells (structures)Thickness measurementTransmission electron microscopyX ray diffractionX ray powder diffractionYttrium oxide

Other Keywords

AluminaAluminum oxideCrystallite sizeHigh resolution transmission electron microscopyNanoparticlesRietveld analysisScanning electron microscopyShells (structures)Thickness measurementTransmission electron microscopyX ray diffractionX ray powder diffractionYttrium oxideCore/shell nanoparticlesPeak broadeningShell thicknessTEM micrographsThicknessWet chemical routeXRD patternsSynthesis (chemical)